Product Overview
The S.T. Japan Micro-Vice SliceIR is a versatile stage-top accessory that combines the functions of a sample holder and a precision sectioning tool. It is specifically designed to hold small, irregular samples securely while allowing the analyst to perform clean cross-sections with a micro-blade. This is critical for analyzing the internal structure of multi-layered films, coated fibers, and electronic components.The vice features a tilting mechanism that allows the sample to be oriented at the perfect angle relative to the microscope objective. The SliceIR configuration includes integrated guides for micro-blades, ensuring that cross-sections are straight and uniform. This tool bridges the gap between bulk sample handling and high-magnification spectroscopic imaging, providing a stable platform for complex failure analysis
Key Features
- 3-Axis Orientation: Tilt and rotate the sample for the perfect viewing angle.
- Integrated Sectioning: Precise guides for creating clean cross-sections.
- Universal Stage Mount: Fits almost any IR or Raman microscope stage.
- Non-Marring Jaws: Securely holds delicate samples without damage.
- Modular Design: Can be configured with different jaws for various sample geometries