Product Overview
The PIKE Mid-IR External Integrating Sphere expands the capabilities of your FTIR spectrometer by allowing the analysis of samples that are too large or awkwardly shaped to fit within the standard sample compartment. By utilizing an external beam port, this accessory captures diffuse and specular reflectance across a wide angular range, making it the definitive tool for calculating total hemispherical reflectance (THR).The sphere is coated with a highly reflective, diffuse gold surface, ensuring exceptional light collection efficiency in the Mid-IR region. It is particularly effective for characterising coatings, textiles, solar materials, and uneven geological samples. The external configuration provides a "top-loading" or "side-loading" sample interface, offering unparalleled flexibility for non-destructive testing in material science
Key Features
- External Port Integration: Utilizes the spectrometer's external beam for analyzing large-scale samples.
- High Reflectivity Coating: Diffuse gold interior provides >94% reflectivity in the Mid-IR.
- Integrated Detector: Features its own high-sensitivity MCT or DTGS detector for optimized performance.
- Versatile Sampling: Ideal for bulky objects, irregular surfaces, and emissivity studies
- Hemispherical Collection: Captures both diffuse and specular components of reflected light.
Specifications
| Wavelength Range | Mid-IR (2.5 – 20 µm) |
| Detector Options | DTGS, MCT (Liquid Nitrogen Cooled) |
| Sample Port Size | 20 mm standard |
| Interface | External beam port compatible |