Product Overview
The Bruker RAMANtouch represents a paradigm shift in Raman microscopy, engineered to overcome the speed limitations of traditional stage-scanning systems. By utilizing innovative galvanometer based laser scanning, the laser beam moves freely across the sample surface with sub-micron precision without the need to move the motorized stage. This approach eliminates mechanical vibrations and sample displacement, enabling ultra-fast imaging speeds of up to 1,330 spectra per second.
A core technical advantage of the RAMANtouch is its proprietary Line Illumination Mode, which re-forms the point laser beam into a homogeneous line to collect up to 400 spectra simultaneously in a single exposure. Combined with dedicated confocal optics, the system provides exceptional depth resolution for non-destructive 3D Raman imaging of transparent samples, such as multilayer films and biological tissues. The integration of advanced automation, including auto-alignment, auto-tuning, and software-controlled laser switching, makes the RAMANtouch a powerful workstation for both complex research and high-throughput defect analysis.
Product Demonstration
Key Features
- Ultra-Fast Line Imaging: Simultaneously captures 400 spectral data points per exposure, achieving measurement speeds hundreds of times faster than conventional systems.
- Galvanometric Beam Steering: Provides rapid and highly accurate laser positioning (down to 10 nm) without moving the sample stage.
- Exceptional 3D Mapping: High-precision confocal optics enable sharp, non-destructive depth profiling and 3D internal structure visualization.
- High Spectral Resolution: Achieves resolution down to 0.5 cm⁻¹ (@785 nm) for detailed analysis of crystal polymorphism and molecular stress.
- AreaFlash™ Technology: "Flashes" the laser line across the field of view to rapidly acquire sensitive average spectra over large areas.
- Fully Automated Operation: Features motorized laser switching, automatic wavelength calibration, and auto-tuning of optical paths for optimal throughput.
- Z-Track Topography: Automatically recognizes surface irregularities to perform clear Raman imaging across uneven or curved samples without blurring.
- Comprehensive Laser Support: Accommodates up to four lasers with a wide selection ranging from UV (325 nm) to NIR (785 nm).
Specifications
| Spatial Resolution | 350 nm (X) x 350 nm (Y) x 1000 nm (Z) |
| Spectral Resolution | 0.5 cm⁻¹ (@785 nm, 1800 line/mm) |
| Imaging Speed | Up to 1,330 spectra/second (Line Illumination Mode) |
| Laser Options | Standard: 532 nm, 785 nm; Optional: 325, 355, 405, 457, 488, 633, 671 nm |
| Scanning Mode | Galvanometer laser scanning (Point, Line, AreaFlash) |
| Detector | Back-illuminated deep depletion CCD, TE-cooled to -70°C |
| Spectrograph | 550 mm focal length Czerny-Turner with 3 automated gratings |